Amorphous silicon imaging system for improved x-ray image capture in nondestructive evaluation

Amorphous silicon imaging system for improved x-ray image capture in nondestructive evaluation

著者名:

Anderson,E.E. ( dpiX,A Xerox New Enterprise Co. )
Hartney,M. ( dpiX,A Xerox New Enterprise Co. )
Weisfield,R.L. ( dpiX,A Xerox New Enterprise Co. )

掲載資料名:

Process control and sensors for manufacturing : 31 March - 1 April 1998, San Antonio, Texas

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

3399

発行年:

1998

開始ページ:

180

終了ページ:

187

出版情報:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819428486 [0819428485]

言語:

英語

請求記号:

P63600/3399

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00017380
シリーズID:	PA00000029
会議名:	Smart Structures : Process Control and Sensors for Manufacturing
回次:	1998
会議開催地:	San Antonio, TX, USA
会議開催年:	1998.03.31-1998.04.01

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