1.

国際会議録
国際会議録
1. SURFACE STUDIES OF SILICON WITH A HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPE
Gibson, J.M. ; McDonald, M.L. ; Unterwald, F.C. ; Gossmann, H.-J. ; Bean, J.C. ; Tung, R.T.
出版情報: Layered structures and epitaxy : symposium held December 2-4, 1985, Boston, Massachusetts, U.S.A..  pp.39-42,  1985.  Pittsburgh, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 56
2.

国際会議録
国際会議録
2. Influence Of Vacuum Annealing on Native Si Point Defects
Gossmann, H.-J. ; Mogi, T.K. ; Rafferty, C.S. ; Stolk, P.A. ; Eaglesham, D.J. ; Luftman, H.S. ; Unterwald, F.C. ; Boone, T. ; Thompson, M.O. ; Poate, J.M.
出版情報: ULSI science and technology, 1995 : proceedings of the Fifth International Symposium on Ultra Large Scale Integration Science and Technology.  pp.177-186,  1995.  Pennington, NJ.  Electrochemical Society
シリーズ名: Electrochemical Society Proceedings Series
シリーズ巻号: 95-5
3.

国際会議録
国際会議録
3. Influence of Flouring and BF2 Implants on the Transient Enhanced Diffusion of Boron
Vuong, H-H. ; Gossmann, H.-J. ; Rafferty, C.S. ; Luftman, H.S. ; Unterwald, F.C. ; Jacobson, D.C. ; Ahrens, R.E ; Boone, T. ; Zeitzoff, P.M.
出版情報: ULSI science and technology, 1995 : proceedings of the Fifth International Symposium on Ultra Large Scale Integration Science and Technology.  pp.6-12,  1995.  Pennington, NJ.  Electrochemical Society
シリーズ名: Electrochemical Society Proceedings Series
シリーズ巻号: 95-5