1.

国際会議録
国際会議録
1. Circuit-Level And Layout-Specific Interconnect Reliability Assessments
Hau-Riege, S.P. ; Thompson, C.V. ; Hau-Riege, C.S. ; Andleigh, V.K. ; Chery, Y. ; Troxel, D.
出版情報: Materials, technology and reliability for advanced interconnects and low-k dielectrics : symposium held April 23-27, 2000, San Francisco, California, U.S.A..  pp.D2.2-,  2001.  Warrendale, PA.  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 612
2.

国際会議録
国際会議録
2. The Effects Of Width Transitions On The Reliability Of Interconnects
Hau-Riege, C.S. ; Thompson, C.V. ; Narieb, T.N.
出版情報: Materials, technology and reliability for advanced interconnects and low-k dielectrics : symposium held April 23-27, 2000, San Francisco, California, U.S.A..  pp.D2.8-,  2001.  Warrendale, PA.  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 612