CHARACTERIZATION OF MBE GaAs LAYERS GROWN AT 200°C-300°C
- 著者名:
Wie, C. R. Xie, K. Berdin, T. T. Fronko, J. G. Look, D. C. Evans, K. R. Stutz, C. E. - 掲載資料名:
- Epitaxial heterostructures : symposium held April 16-19, 1990, San Francisco, California, U.S.A.
- シリーズ名:
- Materials Research Society symposium proceedings
- シリーズ巻号:
- 198
- 発行年:
- 1990
- 開始ページ:
- 383
- 終了ページ:
- 388
- 総ページ数:
- 6
- 出版情報:
- Pittsburgh, Pa.: Materials Research Society
- ISSN:
- 02729172
- ISBN:
- 9781558990876 [1558990879]
- 言語:
- 英語
- 請求記号:
- M23500/198
- 資料種別:
- 国際会議録
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10
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