1.

国際会議録
国際会議録
1. Electrical Characterization of Defects Introduced in n-GaN During High Energy Proton and He-Ion Irradiation
Goodman, S. A. ; Auret, F. D. ; Koschnick, F. K. ; Spaeth, J-M. ; Beaumont, B. ; Gibart, P.
出版情報: GaN and related alloys : symposium held November 30-December 4, 1998, Boston, Massachusetts, U.S.A..  pp.G6.12.1-,  1999.  Warrendale, Pa..  MRS - Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 537
2.

国際会議録
国際会議録
2. Electrical Characterization of Sputter Deposition Induced Defects in n-GaN
Auret, F. D. ; Goodman, S. A. ; Koschnick, F. K. ; Spaeth, J-M. ; Beaumont, B. ; Gibart, P.
出版情報: GaN and related alloys : symposium held November 30-December 4, 1998, Boston, Massachusetts, U.S.A..  pp.G6.13.1-,  1999.  Warrendale, Pa..  MRS - Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 537