1.

国際会議録
国際会議録
1. Tunable-wavelength filter using fiber Bragg gratings combined with a surface micromachining technology
Song,J.-H. ; Taguchi,Y. ; Sasaki,M. ; Hane,K.
出版情報: Optical engineering for sensing and nanotechnology (ICOSN 2001) : 6-8 June 2001, Yokohama, Japan.  pp.478-481,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4416
2.

国際会議録
国際会議録
2. "Electrical properties of ZnS, CdTe/HgCdTe interfaces evaporated from effusion cell in UHV chamber"
Kim,J.-S. ; Song,J.-H. ; Suh,S.-H.
出版情報: Infrared technology and applications XXVI : 30 July - 3 August 2000, San Diego, USA.  pp.816-822,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4130
3.

国際会議録
国際会議録
3. New error-compensation method in a linear encoder using phase-shifted grating
Song,J.-H. ; Kim,K.-C. ; Kim,S.-H. ; Kwak,Y.K.
出版情報: Optical engineering for sensing and nanotechnology (ICOSN '99) : 16-18 June 1999, Yokohama, Japan.  pp.124-127,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3740
4.

国際会議録
国際会議録
4. Hough transform for line and plane detection based on the conjugate formulation
Lee,H.-J. ; Ahn,H.-J. ; Song,J.-H. ; Park,R.-H.
出版情報: Machine Vision Applications in Industrial Inspection IX.  pp.244-252,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4301
5.

国際会議録
国際会議録
5. Detection of moving edges based on the concept of entropy and cross-entropy
Kim,S.H. ; Kim,D.-O. ; Kang,J.-S. ; Song,J.-H. ; Park,R.-H.
出版情報: High-Speed Imaging and Sequence Analysis III.  pp.59-66,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4308