1.

国際会議録
国際会議録
1. Deep Traps and Charge Carrier Lifetimes in 4H-SiC Epilayers
Huh, S.W. ; Sumakeris, J.J. ; Polyakov, A.Y. ; Skowronski, M. ; Klein, P.B. ; Shanabrook, B.V. ; O'Loughlin, M.J.
出版情報: Silicon carbide and related materials - 2005 : proceedings of the International Conference on Silicon Carbide and Related Materials - 2005 : Pittsburgh, Pennsylvania, USA : September 18-23 2005.  pp.493-496,  2006.  Stafa-Zuerich.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 527-529
2.

国際会議録
国際会議録
2. Conditions and Limitations of Using Low-Temperature Photoluminescence to Determine Residual Nitrogen Levels in Semi-Insulating SiC Substrates
Glaser, E.R. ; Shanabrook, B.V. ; Carlos, W.E. ; Chung, H.J. ; Nigam, S. ; Polyakov, A.Y. ; Skowronski, M.
出版情報: Silicon carbide and related materials - 2005 : proceedings of the International Conference on Silicon Carbide and Related Materials - 2005 : Pittsburgh, Pennsylvania, USA : September 18-23 2005.  pp.613-616,  2006.  Stafa-Zuerich.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 527-529