Targets and backgrounds VI : characterization, visualization, and the detection process : 24-26 April 2000, Orlando, USA. pp.81-87, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Machine vision and three-dimensional imaging systems for inspection and metrology : 6-8 November 2001 [i.e. 2000], Boston, USA. pp.248-257, 2000. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Applications of digital image processing XX : 30 July-1 August 1997, San Diego, CA. pp.482-493, 1997. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Intelligent robots and computer vision XVI : Algorithms, techniques, active vision, and materials handling : 15-17 October 1997 Pittsburgh, Pennsylvania. pp.212-223, 1997. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering