1.

国際会議録
国際会議録
1. OBSERVATION AND CHARACTERIZATION OF THE PSEUDOMORPHIC TO STABLE PHASE TRANSITIONS OF Fe1-X Si ON Si(111)
Onda, N. ; Sirringhaus, H. ; Goncalves-Conto, S. ; Schwarz, C. ; Muller-Gubler, E. ; von Kanel, H.
出版情報: Evolution of surface and thin film microstructure : symposium held November 30-December 4, 1992, Boston, Massachusetts, U.S.A..  pp.581-584,  1993.  Pittsburgh, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 280
2.

国際会議録
国際会議録
2. SURFACE RECONSTRUCTIONS OF STRAINED EPITAXIAL CoSi2/Si(100) LAYERS STUDIED BY SCANNING TUNNELING MICROSCOPY
Stalder, R. ; Schwarz, C. ; Sirringhaus, H. ; von Kanel, H.
出版情報: Interface dynamics and growth : symposium held December 2-6, 1991, Boston, Massachusetts, U.S.A..  pp.499-504,  1992.  Pittsburgh, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 237
3.

国際会議録
国際会議録
3. Performance of a 4096 pixel photon counting chip
Bisogni, M.G. ; Campbell, M. ; Conti, M. ; Delogu, P. ; Fantacci, M.E. ; Heijne, E.H.M. ; Maestro, P. ; Magistrati, G. ; Marzulli, V.M. ; Meddeler, G. ; Mikulec, B. ; Pernigotti, E. ; Rosso, V. ; Schwarz, C. ; Snoeys, W. ; Stumbo, S. ; Watt, J.
出版情報: EUV, x-ray, and gamma-ray instrumentation for astronomy IX : 22-24 July 1998 San Diego, California.  pp.298-304,  1998.  Bellingham, Wash..  SPIE
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3445
4.

国際会議録
国際会議録
4. EPITAXIAL SEMICONDUCTING AND METALLIC IRON SILICIDES
Kanel, H. von ; Kafader, U. ; Sutter, P. ; Onda, N. ; Sirringhaus, H. ; Muller, E. ; Kroll, U. ; Schwarz, C. ; Goncalves-Conto, S.
出版情報: Silicides, germanides, and their interfaces : Symposium held November 29-December 2, 1993, Boston, Massachusetts, U.S.A..  pp.73-,  1994.  Pittsburgh, PA.  MRS - Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 320