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An electrostatic analysis of subthreshold behavior in FINFET

著者名:
  • Murugan, B. ( Univ. of Nevada/Las Vegas(USA) )
  • Venkat, R. ( Univ. of Nevada/Las Vegas(USA) )
  • Saha, S. ( Silicon Storage Technology, Inc. (USA) )
掲載資料名:
Data analysis and modeling for process control II : 3-4 March, 2005, San Jose, California, USA
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
5755
発行年:
2005
開始ページ:
157
終了ページ:
165
総ページ数:
9
出版情報:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819457356 [0819457353]
言語:
英語
請求記号:
P63600/5755
資料種別:
国際会議録

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