Image processing and pattern recognition in remote sensing :25-27 October 2002, Hangzhou, China. pp.252-258, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Qian, S. ; Ma, C. ; Qian, J. ; Chen, Y. ; Cai, R. ; Lin, L. ; Qian, W. ; Zou, Y.
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Recent Advances in the Chemistry and Physics of Fullerenes and Related Materials : proceedings of the twelfth International Symposium. pp.390-397, 1999. Pennington, NJ. Electrochemical Society
Sanchez, E. K. ; Graef, M. de ; Qian, W. ; Skowronski, M.
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Defects in electronic materials II : symposium held December 2-6, 1996, Boston, Massachusetts, U.S.A.. pp.655-, 1997. Pittsburgh, Penn. MRS - Materials Research Society
Electronic imaging and multimedia technology IV : 8-11 November 2004, Beijing, China. pp.57-64, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Electronic imaging and multimedia technology IV : 8-11 November 2004, Beijing, China. pp.440-451, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Shen, Y. ; Sankar, R. T. ; Qian, W. ; Sun, X. ; Song, D.
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Applications and science of neural networks, fuzzy systems, and evolutionary computation VI : 5-6 August, 2003, San Diego, California, USA. pp.232-239, 2003. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Electronic, optical and optoelectronic polymers and oligomers : symposium held April 17-20, 2001, San Francisco, California, U.S.A. 2002. Warrendale, Pa.. Materials Research Society
Rohrer, G. S. ; Payne, J. ; Qian, W. ; Skowronski, M. ; Doverspike, K. ; Rowland, L. B. ; Gaskill, D. K.
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Gallium nitride and related materials : the First International Symposium on Gallium Nitride and Related Materials held November 27-December 1, 1995, Boston, Massachusetts, U.S.A.. pp.381-, 1996. Pittsburgh, Pa.. MRS - Materials Research Society
Advanced materials and devices for sensing and imaging II : 8-10 November 2004, Beijing, China. pp.460-469, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Spence, J. C. H. ; Qian, W. ; Lo, W. ; Mo, S. ; Knipping, U. ; Zhang, X.
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Determining nanoscale physical properties of materials by microscopy and spectroscopy. pp.405-, 1994. Pittsburgh, Pa.. MRS - Materials Research Society
Medical Imaging 2002: Image Perception, Observer Performance, and Technology Assessment. pp.273-278, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Plasmonics: Metallic Nanostructures and Their Optical Properties III. pp.592701-592704, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Third International Symposium on Multispectral Image Processing and Pattern Recognition. pp.5-9, 2003. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Third International Symposium on Multispectral Image Processing and Pattern Recognition. pp.224-229, 2003. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Third International Symposium on Multispectral Image Processing and Pattern Recognition. pp.260-264, 2003. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering