1.

国際会議録
国際会議録
1. Observation of Free Carrier Redistribution Resulting from Stacking Fault Formation in Annealed 4H-SiC
Glembocki, O.J. ; Skowronski, M. ; Prokes, S.M. ; Gaskill, D.K. ; Caldwell, J.D.
出版情報: Silicon carbide and related materials - 2005 : proceedings of the International Conference on Silicon Carbide and Related Materials - 2005 : Pittsburgh, Pennsylvania, USA : September 18-23 2005.  pp.347-350,  2006.  Stafa-Zuerich.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 527-529
2.

国際会議録
国際会議録
2. Photoreflectance Characterization and Control of Defects in GaN by Etching With an Inductively Coupled Plasma
Glembocki, O.J. ; Gaskill, D.K. ; Prokes, S.M. ; Pearton, S.W.
出版情報: GaN and related alloys - 2002 : symposium held December 2-6, Boston, Massachusetts, U.S.A..  pp.273-278,  2002.  Warrendale, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 743