1.

国際会議録
国際会議録
1. CNES reliability approach for the qualification of MEMS for space
Pressecq,F. ; Lafontan,X. ; Perez,G. ; Fortea,J.-P.
出版情報: Reliability, testing, and characterization of MEMS/MOEMS : 22-24 October 2001, San Trancisco, USA.  pp.89-96,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4558
2.

国際会議録
国際会議録
2. Physical and reliability issues in MEMS microrelays with gold contacts
Lafontan,X. ; Pressecq,F. ; Perez,G. ; Dufaza,C. ; Karam,J.-M.
出版情報: Reliability, testing, and characterization of MEMS/MOEMS : 22-24 October 2001, San Trancisco, USA.  pp.11-21,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4558
3.

国際会議録
国際会議録
3. MEMS physical analysis in order to complete experimental results return
Lafontan,X. ; Dufaza,C. ; Perez,G. ; Pressecq,F.
出版情報: Design, Test, Integration, and Packaging of MEMS/MOEMS : 9-11 May 2000, Paris, France.  pp.236-243,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4019
4.

国際会議録
国際会議録
4. "Concepts, characterization, and modeling of MEMS microswitches with gold contacts in MUMPs"
Lafontan,X. ; Dufaza,C. ; Robert,M. ; Pressecq,F. ; Perez,G.
出版情報: Design, test, integration, and packaging of MEMS/MOEMS 2001 : 25-27 April 2001, Cannes, France.  pp.381-390,  2001.  Bellingham, Washington.  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4408
5.

国際会議録
国際会議録
5. RF MEMS microswitches design and characterization
Lafontan,X. ; Dufaza,C. ; Robert,M. ; Perez,G. ; Pressecq,F.
出版情報: Materials and Device Characterization in Micromachining III.  pp.149-157,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4175