1.

国際会議録
国際会議録
1. Laplace transform DLTS studies of the DX centers in GaSb and AlGaAs
Dobaczewski,L. ; Hawkins,I.D. ; Kaczor,P. ; Missous,M. ; Poole,I. ; Peaker,A.R.
出版情報: Proceedings of the 16th International Conference on Defects in Semiconductors : Lehigh University, Bethlehem, Pennsylvania, 22-26 July 1991.  Pt.2  pp.769-774,  1992.  Zurich, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 83-87
2.

国際会議録
国際会議録
2. Fine Structure Observed in Thermal Emission Process for the EL2 Defect in GaAs
Dobaczewski,L. ; Kaczor,P. ; Peaker,A.R.
出版情報: Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993.  Pt.2  pp.1001-1006,  1994.  Zurich, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 143-147