1.

国際会議録
国際会議録
1. Laplace transform DLTS studies of the DX centers in GaSb and AlGaAs
Dobaczewski,L. ; Hawkins,I.D. ; Kaczor,P. ; Missous,M. ; Poole,I. ; Peaker,A.R.
出版情報: Proceedings of the 16th International Conference on Defects in Semiconductors : Lehigh University, Bethlehem, Pennsylvania, 22-26 July 1991.  Pt.2  pp.769-774,  1992.  Zurich, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 83-87
2.

国際会議録
国際会議録
2. Silicon Defect characterization by High Resolution Laplace Deep Level Transient Spectroscopy
Peaker,A.R. ; Dobaczewski,L. ; Andersen,O. ; Rubaldo,L. ; Hawkins,I.D. ; Nielsen,K.Bonde ; Evans-Freeman,J.H.
出版情報: High Purity Silicon VI : proceedings of the sixth International Symposium.  pp.549-560,  2000.  Pennington, N.J., Bellingham, Wash..  Electrochemical Society — SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4218