1.

国際会議録
国際会議録
1. Characterization of point defects in semi-insulating InP:Fe by high-resolution photoinduced transient spectroscopy
Kozlowski, R. ; Kaminski, P. ; Pawlowski, M.
出版情報: Solid State Crystals 2002: Crystalline Materials for Optoelectronics.  pp.53-58,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5136
2.

国際会議録
国際会議録
2. Laplace transform photoinduced transient spectroscopy: a new powerful tool for defect characterization in semi-insulating materials
Pawlowski, M. ; Kaminski, P. ; Kozlowski, R. ; Miczuga, M.
出版情報: Solid State Crystals 2002: Crystalline Materials for Optoelectronics.  pp.59-65,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5136