Framework of passive millimeter-wave scene simulation based on material classification [6211-09]

Framework of passive millimeter-wave scene simulation based on material classification [6211-09]

著者名:

Park H.

Kim S.-H.

Lee H.-J.

Kim Y.-H. ( Gwangju Institute of Science and Technology (South Korea) )

Ki J.-S.

Yoon I.-B. ( KCEI Visual System Research Ctr. Institute (South Korea) )

Lee J.-M.

Park S.-J. ( POONGSAN Technical Research Lab. (South Korea) )

さらに 3 件

掲載資料名:

Passive millimeter-wave imaging technology IX : 19 April 2006, Kissimmee, Florida, USA

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

6211

発行年:

2006

開始ページ:

621109

出版情報:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819462671 [0819462675]

言語:

英語

請求記号:

P63600/6211

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00016222
シリーズID:	PA00000029
会議名:	Defense, Security, and Sensing : Passive millimeter-wave imaging technology
回次:	2006 : 9th
会議開催地:	Kissimmee, FL, USA
会議開催年:	2006.04.19

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