1.

国際会議録
国際会議録
1. Temperature Dependence of the Carrier Lifetime in 4H-SiC Epilayers
P.B. Klein ; R.L. Myers-Ward ; K.K. Lew ; B.L. VanMil ; C.R. Eddy Jr.
出版情報: Silicon carbide and related materials 2009 : selected peer reviewed papers from the International Conference on Silicon Carbide and Related Materials 2009, Nurnberg, Germany, October 11-16, 2009.  pp.203-206,  2010.  Aedermannsdorf, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 645-648
2.

国際会議録
国際会議録
2. CL/EBIC-SEM Techniques for Evaluation of Impact of Crystallographic Defects on Carrier Lifetime in 4H-SiC Epitaxial Layers
S.I. Maximenko ; J.A. Freitas Jr. ; Y.N. Picard ; P.B. Klein ; R.L. Myers-Ward
出版情報: Silicon carbide and related materials 2009 : selected peer reviewed papers from the International Conference on Silicon Carbide and Related Materials 2009, Nurnberg, Germany, October 11-16, 2009.  pp.211-214,  2010.  Aedermannsdorf, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 645-648