Atomistic Simulation of the Effect of Trace Elements on Grain Boundary of Aluminium

Atomistic Simulation of the Effect of Trace Elements on Grain Boundary of Aluminium

著者名:

掲載資料名:

Superplasticity in advanced materials, ICSAM-2000 : proceedings of the 2000 International Conference on Superplasticity in Advanced Materials (ICSAM-2000) held at Sheraton International Resort, Orlando [Florida], USA during August 1-4, 2000

シリーズ名:

Materials science forum

シリーズ巻号:

357-359

発行年:

2001

開始ページ:

387

終了ページ:

392

総ページ数:

6

出版情報:

Uetikon-Zuerich, Switzerland: Trans Tech Publications

ISSN:

02555476

ISBN:

9780878498741 [0878498745]

言語:

英語

請求記号:

M23650

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00013316
シリーズID:	PA00000012
会議名:	ICSAM : International Conference on Superplasticity in Advanced Materials
回次:	2000
会議開催地:	Orlando, FL, USA
会議開催年:	2000.08.01-2000.08.04

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