1.

国際会議録
国際会議録
1. Evaluating and Improving SIMS Method for Measuring Nitrogen in SiC
Smith, H.E. ; Eyink, K.G. ; Mitchel, W.C. ; Wood, M.C. ; Fanton, M.A.
出版情報: Silicon carbide and related materials - 2005 : proceedings of the International Conference on Silicon Carbide and Related Materials - 2005 : Pittsburgh, Pennsylvania, USA : September 18-23 2005.  pp.617-620,  2006.  Stafa-Zuerich.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 527-529
2.

国際会議録
国際会議録
2. Characterization and Modeling of GaAs/AlGaAs P-Type Multi-Quantum Wells for Infared Detection at Normal Incidence
Brown, G.J. ; Taferner, W.T. ; Hedge, S.M. ; Eyink, K.G. ; Szmulowicz, F. ; Mitchel, W.C. ; Solomon, J. ; Walck, S.D.
出版情報: Proceedings of the Fifth International Symposium on Long Wavelength Infrared Detectors and Arrays: Physics and Applications.  pp.240-253,  1997.  Pennington, NJ.  Electrochemical Society
シリーズ名: Electrochemical Society Proceedings Series
シリーズ巻号: 97-33