1.

国際会議録
国際会議録
1. The Effect of Doping on Nitrogen Activation Energy Level in 4H-SiC
Evwaraye, A. O. ; Smith, S. R. ; Mitchel, W. C.
出版情報: Defect and impurity engineered semiconductors, II : symposium held April 13-17, 1998, San Francisco, California, U.S.A..  pp.187-,  1998.  Warrendale, Pa.  MRS - Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 510
2.

国際会議録
国際会議録
2. Aluminum Acceptors in Inequivalent Sites in 4H-SiC
Smith, S. R. ; Evwaraye, A. O. ; Mitchel, W. C.
出版情報: Defect and impurity engineered semiconductors, II : symposium held April 13-17, 1998, San Francisco, California, U.S.A..  pp.193-,  1998.  Warrendale, Pa.  MRS - Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 510
3.

国際会議録
国際会議録
3. CHARACTERIZATION OF DEFECTS IN N-TYPE 6H-SiC SINGLE CRYSTALS BY OPTICAL ADMITTANCE SPECTROSCOPY
Evwaraye, A. O. ; Smith, S. R. ; Mitchel, W. C.
出版情報: Physics and applications of defects in advanced semiconductors : symposium held November 29-December 1, 1993, Boston, Massachusetts, U.S.A..  pp.353-,  1994.  Pittsburgh, Pa..  MRS - Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 325
4.

国際会議録
国際会議録
4. Thermal and Optical Admittance Spectroscopy Studies of Defects in 15R-SiC
Smith, S. R. ; Evwaraye, A. O. ; Mitchel, W. C.
出版情報: III-Nitride, SiC, and Diamond Materials for Electronic Devices : symposium held April, 1996, San Francisco, California, U.S.A..  pp.705-,  1996.  Pittsburgh, Pa..  MRS - Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 423
5.

国際会議録
国際会議録
5. Study of Deep Levels by Admittance Spectroscopy in High Resistivity P-Type 6H-SiC Single Crystals
Evwaraye, A. O. ; Smith, S. R. ; Mitchel, W. C.
出版情報: Defect and impurity engineered semiconductors and devices : symposium held April 17-21, 1995, San Francisco, California, U.S.A..  pp.539-,  1995.  Pittsburgh, PA.  MRS - Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 378
6.

国際会議録
国際会議録
6. Impurity Conduction in n-Type 4H-SiC
Evwaraye, A. O. ; Smith, S. R. ; Mitchel, W. C. ; Roth, M. D.
出版情報: III-Nitride, SiC, and Diamond Materials for Electronic Devices : symposium held April, 1996, San Francisco, California, U.S.A..  pp.637-,  1996.  Pittsburgh, Pa..  MRS - Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 423
7.

国際会議録
国際会議録
7. Vanadium-free Semi-insulating 4H-SiC Substrates
Mitchel, W. C. ; Saxler, A. ; Perrin, R. ; Goldstein, J. ; Smith, S. R. ; Evwaraye, A. O. ; Solomon, J. S. ; Brady, M. ; Tsvetkov, V. ; Carter, C. H. Jr.
出版情報: Silicon carbide and related materials - 1999 : ICSCRM'99, proceedings of the International Conference on Silicon Carbide and Related Materials - 1999, Research Triangle Park, North Carolina, USA, October 10-15, 1999.  pp.21-24,  2000.  Zuerich, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 338-342(1)
8.

国際会議録
国際会議録
8. The comparative studies of chemical vapor deposition grown epitaxial layers and of sublimation sandwich method grown 4H-SiC samples
Evwaraye, A. O. ; Smith, S. R. ; Mitchel, W. C.
出版情報: Wide-bandgap semiconductors for high-power, high-frequency, and high temperature applications--1999 : symposium held April 5-8, 1999, San Francisco, California, U.S.A..  pp.237-,  1999.  Warrendale, PA.  MRS-Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 572
9.

国際会議録
国際会議録
9. Characterization of Vanadium-doped 4H-SiC using optical admittance spectroscopy
Smith, S. R. ; Evwaraye, A. O. ; Mitchel, W. C. ; Solomon, J. S. ; Goldstein, J.
出版情報: Wide-bandgap semiconductors for high-power, high-frequency, and high temperature applications--1999 : symposium held April 5-8, 1999, San Francisco, California, U.S.A..  pp.253-,  1999.  Warrendale, PA.  MRS-Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 572
10.

国際会議録
国際会議録
10. Temperature Dependence of Metal-Semiconductor Contacts on 6H-SiC
Smith, S. R. ; Evwaraye, A. O. ; Mitchel, W. C.
出版情報: Defect and impurity engineered semiconductors and devices : symposium held April 17-21, 1995, San Francisco, California, U.S.A..  pp.835-,  1995.  Pittsburgh, PA.  MRS - Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 378