1.

国際会議録
国際会議録
1. Dislocations in GaN/Sapphire: Their Distribution and Effect on Stress and Optical Properties
Jain, S. C. ; Pinardi, K. ; Maes, H. E. ; Overstraeten, R. Van ; Willander, M. ; Atkinson, A.
出版情報: Nitride semiconductors : symposium held December 1-5, 1997, Boston, Massachusetts, U.S.A..  pp.875-,  1998.  Warrendale, Pa..  MRS - Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 482
2.

国際会議録
国際会議録
2. Measurement of Nonuniform Stresses in Semiconductors by the Micro-Raman Method
Pinardi, K. ; Jain, S. C. ; Maes, H. E. ; Overstraeten, R. Van ; Willander M. ; Atkinson, A.
出版情報: Thin-films : stresses and mechanical properties VII : symposium held December 1-5, 1997, Boston, Massachusetts, U.S.A..  pp.507-,  1998.  Warrendale, Pa..  MRS - Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 505