1.

国際会議録
国際会議録
1. Detection of Corrosion - Related Defects in Aluminum Using Positron Annihilation Spectroscopy
Wu, X. ; Asoka-Kumar, P. ; Lynn, K.G.
出版情報: Proceedings of the Seventh International Symposium on Oxide Films on Metals and Alloys.  pp.106-118,  1994.  Pennington, NJ.  Electrochemical Society
シリーズ名: Electrochemical Society Proceedings Series
シリーズ巻号: 1994-25
2.

国際会議録
国際会議録
2. Formation of Interfacial Voids in Aluminum by Oxidation and Dissolution Processes
Hebert, K.R. ; Gessmann, T. ; Lynn, K.G. ; Asoka-Kumar, P.
出版情報: Pits and Pores : formation, properties, and significance for advanced materials : proceedings of the International Symposium.  pp.469-479,  2000.  Pennington, N.J..  Electrochemical Society
シリーズ名: Electrochemical Society Proceedings Series
シリーズ巻号: 2000-25
3.

国際会議録
国際会議録
3. Study of Positronium in Low-k Dielectric Films by Means of 2D-Angular Correlation Experiments at a High-Intensity Slow-Positron Beam
Gessmann, T. ; Petkov, M.P. ; Weber, M.H. ; Lynn, K.G. ; Rodbell, K.P. ; Asoka-Kumar, P. ; Stoeffl, W. ; Howell, R.H.
出版情報: Positron annihilation, ICPA-12 : Proceedings of the 12th International Conference on Positron Annihilation, August 6-12, 2000, München, Germany.  pp.585-587,  2001.  Zuerich, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 363-365
4.

国際会議録
国際会議録
4. Visible-Light Emission From Silicon-Implanted and Annealed SiO2 Layers
Ghislotti, G. ; Nielsen, B. ; Asoka-Kumar, P. ; Lynn, K.G. ; di Mauro, L.F. ; Bottani, C.E. ; Corni, F. ; Tonini, R. ; Ottaviani, G.
出版情報: The physics and chemistry of SiO[2] and the Si-SiO[2] interface-3, 1996 : proceedings of the Third International Symposium on the Physics and Chemistry of SiO[2] and the Si-SiO[2] Interface.  pp.468-476,  1996.  Pennington, NJ.  Electrochemical Society
シリーズ名: Electrochemical Society Proceedings Series
シリーズ巻号: 96-1