Novel optical systems design and optimization IV : 1-2 August , 2001, San Diego, USA. pp.15-25, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Data mining and applications : 23-24 October 2001, Wuhan, China. pp.25-28, 2001. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Microfluidics and bioMEMS : 22-24 October 2001, San Francisco, USA. pp.207-216, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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MEMS design, fabrication, characterization, and packaging : 30 May-1 June 2001, Edinburgh, UK. pp.267-274, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Sensors and camera systems for scientific, industrial, and digital photography applications : 24-26 January 2000, San Jose, USA. pp.420-430, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Storage and retrieval for media databases 2000 : 26-28 January 2000, San Jose, California. pp.442-449, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Micro- and nanofabricated structures and devices for biomedical environmental applications II : 25-26 January 1999, San Jose, California. pp.2-9, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Projection displays V : 26-28 January 1999, San Jose, California. pp.123-131, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Laser techniques for condensed-phase and biological systems : 29-31 January 1998, San Jose, California. pp.186-192, 1998. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Design, test, and microfabrication of MEMS and MOEMS : 30 March-1 April 1999, Paris, France. Part1 pp.249-258, 1999. Bellingham, Wash., USA. SPIE - The International Society for Optical Engineering
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Optical engineering for sensing and nanotechnology (ICOSN '99) : 16-18 June 1999, Yokohama, Japan. pp.307-309, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Optical engineering for sensing and nanotechnology (ICOSN '99) : 16-18 June 1999, Yokohama, Japan. pp.598-601, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Automated optical inspection for industry: theory, technology, and applications II : 16-19 September, 1998, Beijing, China. pp.105-109, 1998. Bellingham, Washington. SPIE-The International Society for Optical Engineering
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Electronic imaging and multimedia systems II : 18-19 September, 1998, Beijing, China. pp.321-325, 1998. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Display devices and systems : 6-7 November 1996, Beijing, China. pp.190-194, 1996. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Current developments in optical elements and manufacturing : 16-18 September 1998, Beijing, China. pp.131-133, 1998. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Sensors, cameras, and applications for digital photography : 27-28 January 1999, San Jose, California. pp.52-62, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Advanced photonic sensors and applications : 30 November-3 December 1999, Singapore. pp.214-222, 1999. Bellingham, Wash., USA. SPIE - The International Society for Optical Engineering
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Engineered nanostructural films and materials : 22-23 July 1999, Denver, Colorado. pp.235-240, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Design, fabrication, and characterization of photonic devices : 30 November-3 December 1999, Singapore. pp.528-533, 1999. Bellingham, Wash., USA. SPIE - The International Society for Optical Engineering
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Third International Conference on Thin Film Physics and Applications : 15-17 April 1997, Shanghai, China. pp.180-182, 1998. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Third International Conference on Thin Film Physics and Applications : 15-17 April 1997, Shanghai, China. pp.426-428, 1998. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Rough surface scattering and contamination : 21-23 July 1999, Denver, Colorado. pp.370-377, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Proceedings of the 17th International Modal Analysis Conference February 8-11, 1999 Hyatt Orlando Hotel Kissimmee, Florida. Part2 pp.2018-2024, 1999. Bethel, CT. SPIE - The International Society for Optical Engineering
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Solid state sensor arrays : development and applications II : 26-27 January 1998, San Jose, California. pp.168-177, 1998. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Optical engineering for sensing and nanotechnology (ICOSN '99) : 16-18 June 1999, Yokohama, Japan. pp.638-641, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Third International Conference on Thin Film Physics and Applications : 15-17 April 1997, Shanghai, China. pp.125-129, 1998. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Enabling photonic technologies for aerospace applications : 5-6 April 1999, Orlando, Florida. pp.139-144, 1999. Bellingham, Wash., USA. SPIE - The International Society for Optical Engineering
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Third International Conference on Thin Film Physics and Applications : 15-17 April 1997, Shanghai, China. pp.412-414, 1998. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Third International Conference on Thin Film Physics and Applications : 15-17 April 1997, Shanghai, China. pp.137-141, 1998. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Third International Conference on Thin Film Physics and Applications : 15-17 April 1997, Shanghai, China. pp.94-97, 1998. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Photodetectors : materials and devices IV : 27-29 January 1999, San Jose, California. pp.409-414, 1999. Bellingham, Wash., USA. SPIE - The International Society for Optical Engineering
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Proceedings of the 16th International Conference on Defects in Semiconductors : Lehigh University, Bethlehem, Pennsylvania, 22-26 July 1991. Pt.2 pp.763-768, 1992. Zurich, Switzerland. Trans Tech Publications
Optical remote sensing of the atmosphere and clouds : 15-17 September 1998, Beijing, China. pp.308-312, 1998. Bellingham. SPIE-The International Society for Optical Engineering
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Electronic imaging and multimedia systems II : 18-19 September, 1998, Beijing, China. pp.336-343, 1998. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Electronic imaging and multimedia systems II : 18-19 September, 1998, Beijing, China. pp.344-350, 1998. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Biomedical spectroscopy : vibrational spectroscopy and other novel techniques : 26-27 January 2000, San Jose, California. pp.235-240, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Biomedical spectroscopy : vibrational spectroscopy and other novel techniques : 26-27 January 2000, San Jose, California. pp.210-214, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Optical measurement and nondestructive testing : Techniques and applications, 8-10 November 2000, Beijing, China. pp.230-233, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Biomedical photonics and optoelectronic imaging : 8-10 November 2000, Beijing, China. pp.114-117, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Fourth International Conference on Thin Film Physics and Applications : 8-11 May 2000, Shanghai, China : proceedings. pp.831-834, 2000. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Fourth International Conference on Thin Film Physics and Applications : 8-11 May 2000, Shanghai, China : proceedings. pp.745-748, 2000. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Fourth International Conference on Thin Film Physics and Applications : 8-11 May 2000, Shanghai, China : proceedings. pp.749-752, 2000. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Fourth International Conference on Thin Film Physics and Applications : 8-11 May 2000, Shanghai, China : proceedings. pp.765-768, 2000. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Fourth International Conference on Thin Film Physics and Applications : 8-11 May 2000, Shanghai, China : proceedings. pp.769-772, 2000. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Fourth International Conference on Thin Film Physics and Applications : 8-11 May 2000, Shanghai, China : proceedings. pp.151-154, 2000. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Advanced photonic sensors : Technology and applications, 8-10 Novenber 2000, Beijing, China. pp.20-24, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Advanced photonic sensors : Technology and applications, 8-10 Novenber 2000, Beijing, China. pp.255-259, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Fourth International Conference on Thin Film Physics and Applications : 8-11 May 2000, Shanghai, China : proceedings. pp.195-198, 2000. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Sensors and camera systems for scientific, industrial, and digital photography applications II : 22-24 January 2001, San Jose, [California] USA. pp.441-449, 2001. Bellingham, Washington. SPIE-The International Society for Optical Engineering
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