Novel optical systems design and optimization IV : 1-2 August , 2001, San Diego, USA. pp.15-25, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Data mining and applications : 23-24 October 2001, Wuhan, China. pp.25-28, 2001. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Microfluidics and bioMEMS : 22-24 October 2001, San Francisco, USA. pp.207-216, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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MEMS design, fabrication, characterization, and packaging : 30 May-1 June 2001, Edinburgh, UK. pp.267-274, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Sensors and camera systems for scientific, industrial, and digital photography applications : 24-26 January 2000, San Jose, USA. pp.420-430, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Storage and retrieval for media databases 2000 : 26-28 January 2000, San Jose, California. pp.442-449, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Micro- and nanofabricated structures and devices for biomedical environmental applications II : 25-26 January 1999, San Jose, California. pp.2-9, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Projection displays V : 26-28 January 1999, San Jose, California. pp.123-131, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Laser techniques for condensed-phase and biological systems : 29-31 January 1998, San Jose, California. pp.186-192, 1998. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Design, test, and microfabrication of MEMS and MOEMS : 30 March-1 April 1999, Paris, France. Part1 pp.249-258, 1999. Bellingham, Wash., USA. SPIE - The International Society for Optical Engineering
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Optical engineering for sensing and nanotechnology (ICOSN '99) : 16-18 June 1999, Yokohama, Japan. pp.307-309, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Optical engineering for sensing and nanotechnology (ICOSN '99) : 16-18 June 1999, Yokohama, Japan. pp.598-601, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Automated optical inspection for industry: theory, technology, and applications II : 16-19 September, 1998, Beijing, China. pp.105-109, 1998. Bellingham, Washington. SPIE-The International Society for Optical Engineering
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Electronic imaging and multimedia systems II : 18-19 September, 1998, Beijing, China. pp.321-325, 1998. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Display devices and systems : 6-7 November 1996, Beijing, China. pp.190-194, 1996. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Current developments in optical elements and manufacturing : 16-18 September 1998, Beijing, China. pp.131-133, 1998. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Sensors, cameras, and applications for digital photography : 27-28 January 1999, San Jose, California. pp.52-62, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Advanced photonic sensors and applications : 30 November-3 December 1999, Singapore. pp.214-222, 1999. Bellingham, Wash., USA. SPIE - The International Society for Optical Engineering
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Engineered nanostructural films and materials : 22-23 July 1999, Denver, Colorado. pp.235-240, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Design, fabrication, and characterization of photonic devices : 30 November-3 December 1999, Singapore. pp.528-533, 1999. Bellingham, Wash., USA. SPIE - The International Society for Optical Engineering
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Third International Conference on Thin Film Physics and Applications : 15-17 April 1997, Shanghai, China. pp.180-182, 1998. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Third International Conference on Thin Film Physics and Applications : 15-17 April 1997, Shanghai, China. pp.426-428, 1998. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Rough surface scattering and contamination : 21-23 July 1999, Denver, Colorado. pp.370-377, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Proceedings of the 17th International Modal Analysis Conference February 8-11, 1999 Hyatt Orlando Hotel Kissimmee, Florida. Part2 pp.2018-2024, 1999. Bethel, CT. SPIE - The International Society for Optical Engineering
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Solid state sensor arrays : development and applications II : 26-27 January 1998, San Jose, California. pp.168-177, 1998. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Optical engineering for sensing and nanotechnology (ICOSN '99) : 16-18 June 1999, Yokohama, Japan. pp.638-641, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Third International Conference on Thin Film Physics and Applications : 15-17 April 1997, Shanghai, China. pp.125-129, 1998. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Enabling photonic technologies for aerospace applications : 5-6 April 1999, Orlando, Florida. pp.139-144, 1999. Bellingham, Wash., USA. SPIE - The International Society for Optical Engineering
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Third International Conference on Thin Film Physics and Applications : 15-17 April 1997, Shanghai, China. pp.412-414, 1998. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Third International Conference on Thin Film Physics and Applications : 15-17 April 1997, Shanghai, China. pp.137-141, 1998. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Third International Conference on Thin Film Physics and Applications : 15-17 April 1997, Shanghai, China. pp.94-97, 1998. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Photodetectors : materials and devices IV : 27-29 January 1999, San Jose, California. pp.409-414, 1999. Bellingham, Wash., USA. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Proceedings of the 16th International Conference on Defects in Semiconductors : Lehigh University, Bethlehem, Pennsylvania, 22-26 July 1991. Pt.2 pp.763-768, 1992. Zurich, Switzerland. Trans Tech Publications
Optical remote sensing of the atmosphere and clouds : 15-17 September 1998, Beijing, China. pp.308-312, 1998. Bellingham. SPIE-The International Society for Optical Engineering
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Electronic imaging and multimedia systems II : 18-19 September, 1998, Beijing, China. pp.336-343, 1998. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Electronic imaging and multimedia systems II : 18-19 September, 1998, Beijing, China. pp.344-350, 1998. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Biomedical spectroscopy : vibrational spectroscopy and other novel techniques : 26-27 January 2000, San Jose, California. pp.235-240, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Biomedical spectroscopy : vibrational spectroscopy and other novel techniques : 26-27 January 2000, San Jose, California. pp.210-214, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Optical measurement and nondestructive testing : Techniques and applications, 8-10 November 2000, Beijing, China. pp.230-233, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Biomedical photonics and optoelectronic imaging : 8-10 November 2000, Beijing, China. pp.114-117, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Fourth International Conference on Thin Film Physics and Applications : 8-11 May 2000, Shanghai, China : proceedings. pp.831-834, 2000. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Fourth International Conference on Thin Film Physics and Applications : 8-11 May 2000, Shanghai, China : proceedings. pp.745-748, 2000. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Fourth International Conference on Thin Film Physics and Applications : 8-11 May 2000, Shanghai, China : proceedings. pp.749-752, 2000. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Fourth International Conference on Thin Film Physics and Applications : 8-11 May 2000, Shanghai, China : proceedings. pp.765-768, 2000. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Fourth International Conference on Thin Film Physics and Applications : 8-11 May 2000, Shanghai, China : proceedings. pp.769-772, 2000. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Fourth International Conference on Thin Film Physics and Applications : 8-11 May 2000, Shanghai, China : proceedings. pp.151-154, 2000. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Advanced photonic sensors : Technology and applications, 8-10 Novenber 2000, Beijing, China. pp.20-24, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Advanced photonic sensors : Technology and applications, 8-10 Novenber 2000, Beijing, China. pp.255-259, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Fourth International Conference on Thin Film Physics and Applications : 8-11 May 2000, Shanghai, China : proceedings. pp.195-198, 2000. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Sensors and camera systems for scientific, industrial, and digital photography applications II : 22-24 January 2001, San Jose, [California] USA. pp.441-449, 2001. Bellingham, Washington. SPIE-The International Society for Optical Engineering
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Sensors and camera systems for scientific, industrial, and digital photography applications II : 22-24 January 2001, San Jose, [California] USA. pp.450-458, 2001. Bellingham, Washington. SPIE-The International Society for Optical Engineering
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Advanced optical manufacturing and testing technology : 1-3 November 2000, Chengdu, China. pp.603-607, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Advanced optical manufacturing and testing technology : 1-3 November 2000, Chengdu, China. pp.504-508, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Advanced optical manufacturing and testing technology : 1-3 November 2000, Chengdu, China. pp.569-572, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Display devices and systems : 6-7 November 1996, Beijing, China. pp.167-171, 1996. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Current developments in optical elements and manufacturing : 16-18 September 1998, Beijing, China. pp.134-137, 1998. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Imaging system technology for remote sensing : 16-17 September 1998, Beijing, China. pp.102-107, 1998. Bellingham. SPIE-The International Society for Optical Engineering
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Third International Conference on Experimental Mechanics : 15-17 October, 2001, Beijing China. pp.481-484, 2001. Bellingham, Washington. SPIE-The International Society for Optical Engineering
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Optical devices and diagnostics in materials science, 1-4 August 2000, San Diego, USA. pp.128-137, 2000. Bellingham, Wash., USA. SPIE - The International Society for Optical Engineering
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Advanced photonic sensors : Technology and applications, 8-10 Novenber 2000, Beijing, China. pp.321-325, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Proceedings of advances in fluorescence sensing technology IV : 24-27 January 1999, San Jose, California. pp.149-155, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Multispectral and hyperspectral image acquisition and processing : 22-24 2001, Wuhan, China. pp.215-219, 2001. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Proceedings of the 17th International Modal Analysis Conference February 8-11, 1999 Hyatt Orlando Hotel Kissimmee, Florida. Part2 pp.1303-1309, 1999. Bethel, CT. SPIE - The International Society for Optical Engineering
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Genomics and proteomics technologies, 22-23 January, 2001, San Jose, USA. pp.59-65, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Advances in nucleic acid and protein analyses,manipulation, and sequencing : 26-27 January 2000, San Jose, California. pp.2-8, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Proceedings of Biomedical Applications of Raman Spectroscopy : 25-26 January 1999, San Jose, California. pp.218-223, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Proceedings of Biomedical Applications of Raman Spectroscopy : 25-26 January 1999, San Jose, California. pp.224-229, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Advanced optical manufacturing and testing technology : 1-3 November 2000, Chengdu, China. pp.456-459, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993. Pt.3 pp.1319-1324, 1994. Zurich, Switzerland. Trans Tech Publications
Automated optical inspection for industry: theory, technology, and applications II : 16-19 September, 1998, Beijing, China. pp.367-370, 1998. Bellingham, Washington. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Third International Conference on Thin Film Physics and Applications : 15-17 April 1997, Shanghai, China. pp.56-59, 1998. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Third International Conference on Thin Film Physics and Applications : 15-17 April 1997, Shanghai, China. pp.328-330, 1998. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Third International Conference on Thin Film Physics and Applications : 15-17 April 1997, Shanghai, China. pp.2-8, 1998. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Laser processing of materials and industrial applications II : 16-19 September 1998, Beijing, China. pp.80-84, 1998. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Third International Conference on Vibration Measurements by Laser Techniques: Advances and Applications, 16-19 June, 1998, Ancona, Italy. pp.630-634, 1998. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Automated optical inspection for industry: theory, technology, and applications II : 16-19 September, 1998, Beijing, China. pp.607-614, 1998. Bellingham, Washington. SPIE-The International Society for Optical Engineering
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Optics for science and new technology : 17th Congress of the International Commission for Optics, August 19-23, 1996, Hotel Riviera(Yusong), Taejon Korea. Part1 pp.227-228, 1996. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Microwave remote sensing of the atmosphere and environment : 15-17 September 1998, Beijing, China. pp.334-339, 1998. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Fiber optic components and optical communication II : 18-19 September, 1998, Beijing, China. pp.41-44, 1998. Bellingham, Washington. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Biomedical optics and lasers : diagnostics and treatment : 16-18 September 1998, Beijing, China. pp.204-208, 1998. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Electro-Optic and second harmonic generation materials, devices, and applications. pp.89-94, 1996. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Biomedical optics and lasers : diagnostics and treatment : 16-18 September 1998, Beijing, China. pp.224-233, 1998. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Fourth International Conference on Vibration Measurements by Laser Techniques : Advances and Applications : 21-23 June, 2000, Ancona, Italy. pp.422-433, 2000. Bellingham, Washington. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995. pp.189-194, 1995. Zurich, Switzerland. Trans Tech Publications
Electro-optic and second harmonic generation materials, devices, and applications II : 18-19 September, 1998, Beijing, China. pp.113-116, 1998. Bellingham, Washington. SPIE-The International Society for Optical Engineering
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Electro-optic and second harmonic generation materials, devices, and applications II : 18-19 September, 1998, Beijing, China. pp.108-112, 1998. Bellingham, Washington. SPIE-The International Society for Optical Engineering
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Intense microwave pulses V : 31 July-1 August 1997, San Diego, California. pp.249-253, 1997. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Proceedings of the 16th International Modal Analysis Conference February 2-5, 1998 Fess Parker's Doubletree Resort Santa Barbara, California. Part2 pp.1763-1769, 1998. Bethel, CT. Society for Experimental Mechanics
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Proceedings of SPIE - the International Society for Optical Engineering
Microwave remote sensing of the atmosphere and environment : 15-17 September 1998, Beijing, China. pp.185-189, 1998. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Electro-optic and second harmonic generation materials, devices, and applications II : 18-19 September, 1998, Beijing, China. pp.147-151, 1998. Bellingham, Washington. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Wavelet applications in signal and image processing IV : 6-9 August 1996, Denver, Colorado. Part2 pp.942-949, 1996. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Laser processing of materials and industrial applications II : 16-19 September 1998, Beijing, China. pp.378-382, 1998. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Computer-aided design and computer graphics : Fourth International Conference on Computer-Aided Design and Computer Graphics : 23-25 October, 1995, Wuhan, China. pp.261-266, 1996. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Automated optical inspection for industry: theory, technology, and applications II : 16-19 September, 1998, Beijing, China. pp.304-307, 1998. Bellingham, Washington. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Electronic imaging and multimedia systems II : 18-19 September, 1998, Beijing, China. pp.423-429, 1998. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Display devices and systems II : 16-17 September 1998, Beijing, China. pp.84-88, 1998. Bellingham, Washington. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Algorithms for synthetic aperture radar imagery IV : 23-24 April 1997, Orlando, Florida. pp.379-387, 1997. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Display devices and systems II : 16-17 September 1998, Beijing, China. pp.122-131, 1998. Bellingham, Washington. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Photodetectors : materials and devices IV : 27-29 January 1999, San Jose, California. pp.163-171, 1999. Bellingham, Wash., USA. SPIE - The International Society for Optical Engineering
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A collection of technical papers : 35th intersociety energy conversion engineering conference & exhibit (IECEC), Las Vegas, Nevada, 24 July - 28 July 2000. v. 2 pp.1046-1052, 2000. [Reston, VA]. American Institute of Aeronautics and Astronautics
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AIAA Paper : Intersociety Energy Conversion Engineering Conference and Exhibit (IECEC)