Calculation of extended bidirectional reflectance distribution function for subsurface defect scattering [6150-184]
- 著者名:
Shen, J. ( Shanghai Institute of Optics and Fine Mechanics, CAS (China) and Chinese Academy of Sciences (China) ) Liu, S ( Shanghai Institute of Optics and Fine Mechanics, CAS (China) and Chinese Academy of Sciences (China) ) Kong, W ( Shanghai Institute of Optics and Fine Mechanics, CAS (China) and Chinese Academy of Sciences (China) ) Shen, Z ( Shanghai Institute of Optics and Fine Mechanics, CAS (China) and Chinese Academy of Sciences (China) ) Shao, J ( Shanghai Institute of Optics and Fine Mechanics, CAS (China) ) Fan, Z ( Shanghai Institute of Optics and Fine Mechanics, CAS (China) ) - 掲載資料名:
- 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 6150
- 発行年:
- 2006
- パート:
- 2
- 開始ページ:
- 615035
- 出版情報:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819461896 [081946189X]
- 言語:
- 英語
- 請求記号:
- P63600/6150
- 資料種別:
- 国際会議録
類似資料:
SPIE - The International Society of Optical Engineering |
SPIE - The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
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3
国際会議録
Numerical simulation of rough surface bidirectional reflectance distribution function (BRDF)
Society of Photo-optical Instrumentation Engineers |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |
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ESA Communication Production Office |
SPIE - The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |