1.
国際会議録 |
Aboudihab, I. ; Tork, A. ; Lessard, R.A.
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2.
国際会議録 |
2. X-ray reflectometry applied to amorphous carbon thin films prepared by sputtering radio frequency
Aboudihab, I. ; Ech-chamikh, E. ; Lessard, R.A.
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