Surface scattering and diffraction for advanced metrology II : 9 July 2002 Seattle, Washington, USA. pp.7-14, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Lee, S.-W. ; Ishimaru, A. ; Kuga, Y. ; Jandhyala, V.
出版情報:
Complex mediums III : beyond linear isotropic dielectrics : 8-10 July 2002, Seattle, [Washington] USA. pp.92-99, 2002. Bellingham, Washington. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering