1.

国際会議録
国際会議録
1. Principles of highest-precision optical parts estimation on the basis of a point-diffraction interferometer
Voznesensky, N.B. ; Lee, K.-H. ; Kirillovsky, V.K.
出版情報: Optical fabrication, testing, and metrology : 30 September-3 October 2003, St. Etienne, France.  pp.241-251,  2004.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5252
2.

国際会議録
国際会議録
2. Concept of far-field optical evaluation of the apparatus function of an SNOM tip
Voznesensky, N.B. ; Veiko, V.P. ; Ivanova, T.V. ; Lee, K.-H.
出版情報: Laser-Assisted Micro- and Nanotechnologies 2003.  pp.50-62,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5399
3.

国際会議録
国際会議録
3. Interferometers with diffraction on dot aperture for testing of shape errors of precise surfaces
Kirillovsky, V.K. ; Voznesensky, N.B. ; Troukhine, M.M. ; Lee, K.-H.
出版情報: Laser-Assisted Micro- and Nanotechnologies 2003.  pp.77-87,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5399