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Error rate improvement of super-RENS random signal with the minimum mark length of 75 nm in 405 nm 0.85 NA system [6282-66]

著者名:
Bae, J.
Kim, J.
Hwang, I
Kim, H.
Lee, J.
Park, H. ( Samsung Electronics Co., Ltd. (South Korea) )
Tominaga, J. ( National Institute of Advanced Industrial Science and Technology (Japan) )
さらに 2 件
掲載資料名:
Optical Data Storage 2006 : 23-26 April 2006, Montreal, Canada
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
6282
発行年:
2006
開始ページ:
628217
終了ページ:
628218
総ページ数:
2
出版情報:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819463579 [0819463574]
言語:
英語
請求記号:
P63600/6282
資料種別:
国際会議録

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