1.

国際会議録
国際会議録
1. International round-robin experiment on optical total scattering at 633 nm according to ISO/DIS 13696
Kadkhoda,P. ; Amra,C. ; Bennett,J.M. ; Deumie,C. ; Duparre,A. ; Gliech,S. ; Jolie,C. ; Kessler,H. ; Lauth,H. ; Lindstroem,T. ; Muller,A. ; Reng,N. ; Ribbing,C.G. ; Ristau,D. ; Schuhmann,U. ; Tilsch,M.
出版情報: Optical fabrication and testing : 26-28 May 1999, Berlin, Germany.  pp.548-556,  1999.  Bellingham, WA.  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3739
2.

国際会議録
国際会議録
2. Coated optics for DUV-excimer laser applications
Ullmann,J. ; Mertin,M. ; Lauth,H. ; Bernitzki,H. ; Mann,K. ; Ristau,D. ; Arens,W. ; Thielsch,R. ; Kaiser,N.
出版情報: Laser-induced damage in optical materials, 1999 : 31th Annual Boulder Damage Symposium, proceedings, 4-7, October, 1999, Boulder, Colorado.  pp.514-527,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3902
3.

国際会議録
国際会議録
3. Properties of fluoride DUV excimer laser optics:influence of the number of dielectric layers
Arens,W. ; Ristau,D. ; Ullmann,J. ; Zaczek,C. ; Thielsch,R. ; Kaiser,N. ; Duparre,A. ; Apel,O. ; Mann,K.R. ; Lauth,H. ; Bernitzki,H. ; Ebert,J. ; Schippel,St. ; Heyer,H.
出版情報: Laser-induced damage in optical materials, 1999 : 31th Annual Boulder Damage Symposium, proceedings, 4-7, October, 1999, Boulder, Colorado.  pp.250-259,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3902
4.

国際会議録
国際会議録
4. Coated optics for DUV excimer laser applications
Ullmann,J. ; Mertin,M. ; Lauth,H. ; Bernitzki,H. ; Mann,K.R. ; Ristau,D. ; Arens,W. ; Thielsch,R. ; Kaiser,N.
出版情報: Laser-Induced Damage in Optical Materials: 1998.  pp.64-64,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3578