1.

国際会議録
国際会議録
1. Multispectral imaging Fabry-Perot interferometer for tropospheric trace species detection
Larar, A. M. ; Cook, W. B. ; Puschell, J. J. ; Skinner, W. R.
出版情報: Multispectral and hyperspectral remote sensing instruments and applicaionts :25-27 October 2002, Hangzhou, China.  pp.109-117,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4897
2.

国際会議録
国際会議録
2. Tropospheric Trace Species Sensing FPI: program overview and measurement concept validation
Larar, A. M. ; Cook, W. B. ; Mills, C. S. ; Flood, M. A. ; Puschell, J. J. ; Skinner, W. R.
出版情報: Multispectral and hyperspectral remote sensing instruments and applications II : 9-11 November 2004, Honolulu, Hawaii, USA.  pp.163-171,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5655
3.

国際会議録
国際会議録
3. TTSS-FPI: airborne prototype development and performance verification
Cook, W. B. ; Larar, A. M. ; Mills, C. S. ; Flood, M. A. ; Puschell, J. J. ; Skinner, W. R.
出版情報: Multispectral and hyperspectral remote sensing instruments and applications II : 9-11 November 2004, Honolulu, Hawaii, USA.  pp.172-180,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5655
4.

国際会議録
国際会議録
4. Trace Tropospheric Species Sensing-Fabry-Perot Interferometer (TTSS-FPI): spaceborne sensor concept studies for measuring tropospheric ozone
Puschell, J. J. ; Hastings, C. T. ; Chrien, T. ; Larar, A. M. ; Cook, W. B. ; Mills, C. S. ; Flood, M. A. ; Skinner, W. B.
出版情報: Multispectral and hyperspectral remote sensing instruments and applications II : 9-11 November 2004, Honolulu, Hawaii, USA.  pp.181-189,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5655