1.

国際会議録
国際会議録
1. DEFECTS INDUCED BY PROTONS AND ｦﾃ-RAYS IN SEMI-INSULATING GaAs DETECTORS
Castaldini, A. ; Cavallini, A. ; Papa, C. del ; Fuochi, G. ; Alietti, M. ; Canali, C. ; Nava, F. ; Paccagnella, A. ; Lanzieri, C.
出版情報: Microstructure of irradiated materials : Symposium held November 29-1 December, 1994, Boston, Massachusetts USA.  pp.523-,  1995.  Pittsburgh, Pa.  MRS - Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 373
2.

国際会議録
国際会議録
2. SiC X-Ray Detectors for Spectroscopy and Imaging over a Wide Temperature Range
Bertuccio, G. ; Casiraghi, R. ; Gatti, E. ; Maiocchi, D. ; Nava, F. ; Canali, C. ; Cetronio, A. ; Lanzieri, C.
出版情報: Silicon carbide and related materials 2002 : ECSCRM2002, proceedings of the 4th European Conference on Silicon Carbide and Related Materials, September 2-5, 2002, Linköping, Sweden.  pp.941-944,  2003.  Zuerich, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 433-436
3.

国際会議録
国際会議録
3. Influence of Ohmic Contacts on Semi-Insulating GaAs Detector Performances
Castaldini, A. ; Cavallini, A. ; Canali, C. ; Chiossi, C. ; Papa, C. del ; Nava, F. ; Lanzieri, C.
出版情報: Diagnostic techniques for semiconductor materials processing II : symposium held November 27-30, 1995, Boston, Massachusetts, U.S.A..  pp.431-,  1996.  Pittsburgh, Pa..  MRS - Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 406
4.

国際会議録
国際会議録
4. Comprehensive Hot Electron Assessment of Ku-Band AlGaAs/GaAs Power HFETs: Electrical Characterization, Accelerated Stress, and Simulation
Dieci, D. ; Tomasi, T ; Canali, C. ; Menozzi, R. ; Sozzi, G. ; Lanzieri, C.
出版情報: Proceedings, European Space Components Conference, ESCCON 2000, 21-23 March 2000, ESTEC, Noordwijk, the Netherlands.  pp.205-210,  2000.  Noordwijk, The Netherlands.  ESA Publications Division
シリーズ名: ESA SP
シリーズ巻号: 439