Wang, Z. ; Sakoglu, O. ; Annamalai, S. ; Weisse-Bernstein, N.-R. ; Dowd, P. ; Tyo, J.S. ; Hayat, M.M. ; Krishna, S.
出版情報:
Imaging spectrometry X : 2-4 August 2004, Denver, Colorado, USA. pp.73-83, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering