Interference pattern analysis of optical CDMA system using the SCAE and SCAD

Interference pattern analysis of optical CDMA system using the SCAE and SCAD

著者名:

掲載資料名:

Optoelectronic interconnects VII : photonics packaging and integrations II : 24-26 January 2000, San Jose, California

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

3952

発行年:

2000

開始ページ:

31

終了ページ:

39

出版情報:

Bellingham, Wash.: SPIE - The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819435699 [0819435694]

言語:

英語

請求記号:

P63600/3952

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00017172
シリーズID:	PA00000029
会議名:	Photonics West - Optoelectronic Materials and Devices : Optoelectronic interconnects ; Photonics packaging and integrations
回次:	2000 : 7th ; 2nd
会議開催地:	San Jose, CA, USA
会議開催年:	2000.01.24-2000.01.26

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