Analysis of Compositionally and Structurally Graded Si:H and Si₁₋xGex:H Thin Films by Real Time Spectroscopic Ellipsometry
- 著者名:
Nikolas J. Podraza Jing Li Christopher R. Wronski Mark W. Horn Elizabeth C. Dickey Robert W. Collins - 掲載資料名:
- Amorphous and polycrystalline thin-film silicon science and technology--2008 : symposium held March 25-28, 2008, San Francisco, California, U.S.A.
- シリーズ名:
- Materials Research Society symposium proceedings
- シリーズ巻号:
- 1066
- 発行年:
- 2008
- 開始ページ:
- 253
- 終了ページ:
- 258
- 総ページ数:
- 6
- 出版情報:
- Warrendale, Pa.: Materials Research Society
- ISSN:
- 02729172
- ISBN:
- 9781605110363 [1605110361]
- 言語:
- 英語
- 請求記号:
- M23500/1066
- 資料種別:
- 国際会議録
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*SURFACE MICROSTRUCTURAL EVOLUTION OF ULTRATHIN FILMS BY REAL TIME SPECTROSCOPIC ELLIPSOMETRY
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