1.

国際会議録
国際会議録
1. Image detection system for 157-nm using fluorescent glass
Otani, Y. ; Takahashi, M. ; Jin, L. ; Kowa, H. ; Umeda, N.
出版情報: Advanced characterization techniques for optics, semiconductors, and nanotechnologies : 3-5 August 2003, San Diego, California, USA.  pp.134-137,  2003.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5188
2.

国際会議録
国際会議録
2. Mueller matrix polarimeter in 157nm
Jin, L. ; Kowa, H. ; Otani, Y. ; Umeda, N.
出版情報: Advanced characterization techniques for optics, semiconductors, and nanotechnologies : 3-5 August 2003, San Diego, California, USA.  pp.146-153,  2003.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5188
3.

国際会議録
国際会議録
3. Two-dimensional birefringence measurement using liquid crystal retarder for plastic disk inspection
Otani, Y. ; Jin, L. ; Sakaino, Y.
出版情報: Advanced materials and devices for sensing and imaging : 17-18 October 2002, Shanghai, China.  pp.190-194,  2002.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4919
4.

国際会議録
国際会議録
4. Measurement of characteristics of magnetic fluid by Mueller matrix inaging polarimeter
Jin, L. ; Hamada, T. ; Otani, Y.
出版情報: Advanced materials and devices for sensing and imaging : 17-18 October 2002, Shanghai, China.  pp.183-189,  2002.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4919