1.

国際会議録
国際会議録
1. Structural Characterization of SiC Epitaxial Layers Grown on Porous SiC Substrates
Saddow, S.E. ; Melnychuk, G. ; Mynbaeva, M. ; Nikitina, I. ; Vetter, W.M. ; Jin, L. ; Dudley, M. ; Shamsuzzoha, M. ; Dmitriev, V. ; Wood, C.E.C
出版情報: Silicon carbide--materials, processing and devices : symposium held November 27-29, 2000, Boston, Massachusetts, U.S.A..  2001.  Warrendale, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 640
2.

国際会議録
国際会議録
2. Structural Investigation on the Nature of Surface Defects Present in Silicon Carbide Wafers Containing Varying Amount of Micropipes
Shamsuzzoha, M. ; Saddow, S. E. ; Schattner, T. E. ; Jin, L. ; Dudley, M. ; Rendakova, S. V. ; Dmitriev, V. A.
出版情報: Silicon carbide and related materials - 1999 : ICSCRM'99, proceedings of the International Conference on Silicon Carbide and Related Materials - 1999, Research Triangle Park, North Carolina, USA, October 10-15, 1999.  pp.453-456,  2000.  Zuerich, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 338-342(1)