Object detection, classification, and tracking technologies : 22-24 October 2001, Wuhan, China. pp.176-181, 2001. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Smart structures and materials 2001 : damping and isolation : 5-7 March, 2001, Newport Beach, USA. pp.121-129, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Materials for infrared detectors : 30 July-1 August 2001, San Diego, USA. pp.78-84, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Automated optical inspection for industry: theory, technology, and applications II : 16-19 September, 1998, Beijing, China. pp.105-109, 1998. Bellingham, Washington. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Applications of artificial neural networks in image processing II : 12-13 February, 1997, San Jose, California. pp.21-28, 1997. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Electro-optic and second harmonic generation materials, devices, and applications II : 18-19 September, 1998, Beijing, China. pp.14-20, 1998. Bellingham, Washington. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Human vision and electronic imaging III : 26-29 January, 1998, San Jose, California. pp.340-350, 1998. Bellingham, Washington. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Rough surface scattering and contamination : 21-23 July 1999, Denver, Colorado. pp.354-361, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Rough surface scattering and contamination : 21-23 July 1999, Denver, Colorado. pp.362-369, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Photodetectors : materials and devices V : 26-28 January 2000, San Jose, California. pp.227-232, 2000. Bellingham, Wash., USA. SPIE - The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering