1.

国際会議録
国際会議録
1. Near-field birefringence response in thickness direction of liquid crystal thin film
J. Qin ; N. Umeda
出版情報: Instrumentation, metrology, and standards for nanomanufacturing : 29-30 August 2007, San Diego, California, USA.  2007.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 6648
2.

国際会議録
国際会議録
2. Near-field birefringence response of IPS liquid crystal thin film detected by Bi-SNOM
J. Qin ; N. Umeda
出版情報: Fifth International Symposium on Instrumentation Science and Technology.  2  pp.71333D-1-71333D-9,  2008.  Bellingham, Wash..  Society of Photo-optical Instrumentation Engineers
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 7133