Medical imaging 2007, Visualization and image-guided procedures : 18-20 February 2007, San Diego, California, USA. 2007. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Progress in biomedical optics and imaging. vol.8, no.26
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Genetically engineered and optical probes for biomedical applications IV : 23-24 January 2007, San Jose, California, USA. 2007. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Geoinformatics 2007, Geospatial information science : 25-27 May 2007, Nanjing, China. 2007. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Geoinformatics 2006 : Geospatial information science : 28-29 October 2006, Wuhan, China. pp.642017-1-642017-10, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Geoinformatics 2006 : Geospatial information science : 28-29 October 2006, Wuhan, China. pp.642022-1-642022-10, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
M. Zeng ; J. Chen ; L. Wu ; C. Chen ; Y. Chen ; H. Shang ; L. Niu ; M. Zhou ; Q. Hu ; P. Zhu
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Geoinformatics 2006 : Geospatial information science : 28-29 October 2006, Wuhan, China. pp.64201Q-1-64201Q-13, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Geoinformatics 2006 : Geospatial information science : 28-29 October 2006, Wuhan, China. pp.64200X-1-64200X-9, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo -Electronic Technology, and Artificial Intelligence : 13-15 October 2006, Beijing, China. pp.63573O-1-63573O-7, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering