Blank Cover Image

High-spectral-purity VCSELs for spectroscopy and sensors

著者名:
Zappe,H.P. ( Ctr Suisse d'Electronique et de Microtechnique )
Sopra,F.M.di
Gauggel,H.-P.
Gulden,K.H.
Hovel,R.
Moser,M.
さらに 1 件
掲載資料名:
Laser diodes and leds in industrial, measurement, imaging, and sensors applications II : testing, packaging, and reliability of semiconductor lasers V : 26-25 January 2000, San Jose, California
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
3945
発行年:
2000
開始ページ:
106
終了ページ:
116
出版情報:
Bellingham, Wash.: SPIE - The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819435620 [0819435627]
言語:
英語
請求記号:
P63600/3945
資料種別:
国際会議録

類似資料:

1 国際会議録 VCSEL arrays

Hunziker,S.G., Eitel,S., Gulden,K.H., Moser,M., Hovel,R., Gauggel,H.-P., Brunner,M.

SPIE-The International Society for Optical Engineering

Royo,P., Stanley,R.P., Ilegems,M., Streubel,K.P., Moser,M., Gulden,K.H.

SPIE-The International Society for Optical Engineering

Verschaffelt,G., Albert,J., Peeters,M., Panajotov,K., Danckaert,J., Veretennicoff,I.P., Thienpont,H., Sopra,F.Monti di, …

SPIE - The International Society for Optical Engineering

Zappe, H.P.

Electrochemical Society

Eitel, S., Hunziker, S.G., Vez, D., Moser, M., Hoevel, R., Gauggel, H.-P., Brunner, M., Gulden, K.H.

SPIE-The International Society for Optical Engineering

Gulden, K., Gao, Y., Royo, P., Brunner, M.

SPIE - The International Society of Optical Engineering

Vez, D., Eitel, S., Hunziker, S.G., Knight, G., Moser, M., Hoevel, R., Gauggel, H.-P., Brunner, M., Hold, A., Gulden, …

SPIE-The International Society for Optical Engineering

Greger,E., Kippenberg,T., Kiesel,P., Moser,M., Gulden,K.H., Dohler,G.H.

SPIE-The International Society for Optical Engineering

Gulden,K., Moser,M., Luscher,S.

SPIE-The International Society for Optical Engineering

Zappe,H.P., Hofstetter,D., Maisenholder,B., Moser,M., Riel,P., Kunz,R.E.

SPIE-The International Society for Optical Engineering

Sopra,F.Monti di, Brunner,M., Hovel,R., Moser,M., Kapon,E.E.

SPIE-The International Society for Optical Engineering

Maisenholder,B., Zappe,H.P., Kunz,R.E., Riel,P., Moser,M., Duveneck,G.L.

SPIE-The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12