1.

国際会議録
国際会議録
1. MEASURING THE STRENGTH AND STIFFNESS OF THIN FILM MATERIAL BY MECHANICALLY DEFLECTING CANTILEVER MICROBEAMS
Weihs, T.P. ; Hong, S. ; Bravman, J.C. ; Nix, W.D.
出版情報: Thin films : stresses and mechanical properties : symposium held November 28-30, 1988, Boston, Massachusetts, U.S.A..  pp.87-92,  1989.  Pittsburgh, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 130
2.

国際会議録
国際会議録
2. THE DETERMINATION OF MECHANICAL PARAMETERS AND RESIDUAL SRESSES FOR THIN FILMS USING MICRO-CANTILEVER BEAMS
Hong, S. ; Weihs, T.P. ; Bravman, J.C. ; Nix, W.D.
出版情報: Thin films : stresses and mechanical properties : symposium held November 28-30, 1988, Boston, Massachusetts, U.S.A..  pp.93-98,  1989.  Pittsburgh, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 130
3.

国際会議録
国際会議録
3. Nonlocal transport and thermal noise of the nanoscale MOSFET
Jin, S. ; Hong, S. ; Kim, J. ; Park, Y. J. ; Min, H. S.
出版情報: Noise in devices and circuits II : 26-28 May 2004, Maspalomas, Gran Canaria, Spain.  pp.74-83,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5470
4.

国際会議録
国際会議録
4. Attainment of Low Resistivity Polycide Films Using Rapid Thermal Annealing
Yoon, H.A. ; Chen, C. ; Singhal, A. ; Lapes, D. ; Miner, G. ; Hong, S. ; Yamazaki, M. ; Maeda, Y.
出版情報: Advances in rapid thermal processing : proceedings of the symposium.  pp.249-256,  1999.  Pennington, N. J..  Electrochemical Society
シリーズ名: Electrochemical Society Proceedings Series
シリーズ巻号: 99-10
5.

国際会議録
国際会議録
5. A controlled outdoor test site for evaluation of soil effects on landmine detection sensors
van Dam, R.L. ; Hendrickx, J.M. ; Borchers, B. ; Hong, S. ; Miller, T.W. ; Harmon, R.S.
出版情報: Detection and remediation technologies for mines and minelike targets IX : 12-16 April 2004, Orlando, Florida, USA.  pp.1335-1344,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5415
6.

国際会議録
国際会議録
6. Process-structure-property interrelationships of copper for electronic applications
Woodman, A.S. ; Taylor, E.J. ; Anderson, E.B. ; Weil, R. ; Hong, S. ; Knapke, D.H. ; Fisher, G.L.
出版情報: Proceedings of the Second International Symposium on Electrochemical Technology Applications in Electronics.  pp.86-98,  1993.  Pennington, NJ.  Electrochemical Society
シリーズ名: Electrochemical Society Proceedings Series
シリーズ巻号: 1993-20
7.

国際会議録
国際会議録
7. MATERIALS AND STRUCTURES FOR HIGH DENSITY I/O INTERCONNECTION SYSTEMS
Hong, S. ; Bravman, J. C. ; Weihs, T. P. ; Kwon, O. K.
出版情報: Electronic packaging materials science III : symposium held November 30-December 4, 1987, Boston, Massachusetts, U.S.A..  pp.309-318,  1988.  Pittsburgh, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 108
8.

国際会議録
国際会議録
8. Quantum structure far-infrared photodetectors (Invited Paper)
Hong, S. ; Lee, U. ; Park, J. ; Lee, D.
出版情報: Photonics technology in the 21st century : 27-29 November 2001, Singapore /John H. Marsh, Pallab Bhattacharya, Osamu Wada, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering, Nanyang Technological University(Singapore).  pp.36-43,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4598
9.

国際会議録
国際会議録
9. Controlled field experiments of wind effects on thermal signatures of buried and surface-laid landmines
van Dam, R.L. ; Borchers, B. ; Hendrickx, J.M. ; Hong, S.
出版情報: Detection and remediation technologies for mines and minelike targets IX : 12-16 April 2004, Orlando, Florida, USA.  pp.648-657,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5415
10.

国際会議録
国際会議録
10. Influence of Nitrogen or Argon Anneals on the Properties of SIMOX Wafers and Devices
Cristoloveanu, S. ; Ionescu, A. ; Wetteroth, T. ; Shin, H. ; Munteanu, D. ; Gentil, P. ; Hong, S. ; Wilson, S. R.
出版情報: Amorphous and crystalline insulating thin films--1996 : symposium held December 2-4, 1996, Boston, Massachusetts, U.S.A..  pp.213-,  1997.  Pittsburgh, Pa..  MRS - Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 446