1.

国際会議録
国際会議録
1. MEASURING THE STRENGTH AND STIFFNESS OF THIN FILM MATERIAL BY MECHANICALLY DEFLECTING CANTILEVER MICROBEAMS
Weihs, T.P. ; Hong, S. ; Bravman, J.C. ; Nix, W.D.
出版情報: Thin films : stresses and mechanical properties : symposium held November 28-30, 1988, Boston, Massachusetts, U.S.A..  pp.87-92,  1989.  Pittsburgh, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 130
2.

国際会議録
国際会議録
2. THE DETERMINATION OF MECHANICAL PARAMETERS AND RESIDUAL SRESSES FOR THIN FILMS USING MICRO-CANTILEVER BEAMS
Hong, S. ; Weihs, T.P. ; Bravman, J.C. ; Nix, W.D.
出版情報: Thin films : stresses and mechanical properties : symposium held November 28-30, 1988, Boston, Massachusetts, U.S.A..  pp.93-98,  1989.  Pittsburgh, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 130