Real-time monitoring and control during MBE growth of GaAs/AIGaAs Bragg reflectors using multiwave ellipsometry
- 著者名:
Wagner,T. ( LOT-Oriel GmbH(FRG) ) Johs,B.D. ( J.A.Woollam Co.(USA) ) Herzinger,C.M. ( J.A.Woollam Co.(USA) ) He,P. ( J.A.Woollam Co.(USA) ) Pittal,S. ( J.A.Woollam Co.(USA) ) Woollam,J.A. ( J.A.Woollam Co.(USA) ) - 掲載資料名:
- Polarimetry and ellipsometry : 20-23 May, 1996, Kazimierz Dolny, Poland
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 3094
- 発行年:
- 1997
- 開始ページ:
- 301
- 終了ページ:
- 307
- 出版情報:
- Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819425096 [0819425095]
- 言語:
- 英語
- 請求記号:
- P63600/3094
- 資料種別:
- 国際会議録
類似資料:
SPIE-The International Society for Optical Engineering |
Society of Vacuum Coaters |
SPIE-The International Society for Optical Engineering |
MRS - Materials Research Society |
MRS - Materials Research Society |
MRS - Materials Research Society |
Society of Vacuum Coaters |
Materials Research Society |
Materials Research Society |
Society of Vacuum Coaters |
Materials Research Society |
SPIE-The International Society for Optical Engineering |