Cross-Sectional AFM of Oxidized Porous Silicon
- 著者名:
- 掲載資料名:
- Atomic resolution microscopy of surfaces and interfaces : symposium held December 3-5, 1996, Boston, Massachusetts, U.S.A.
- シリーズ名:
- Materials Research Society symposium proceedings
- シリーズ巻号:
- 466
- 発行年:
- 1997
- 開始ページ:
- 63
- 出版情報:
- Pittsburgh, Pa.: MRS - Materials Research Society
- ISSN:
- 02729172
- ISBN:
- 9781558993709 [1558993703]
- 言語:
- 英語
- 請求記号:
- M23500/466
- 資料種別:
- 国際会議録
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A Waveguide on the Oxidized Porous Silicon for the Robust Alignment in the Silicon Optical Bench
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