1.

国際会議録
国際会議録
1. "Advanced x-ray/EUV diagnostics for spectroscopy, imaging, and polarimetry at the Nevada Terawatt Facility z-pinch plasma source"
Kantsyrev,V.L. ; Bauer,B.S. ; Shlyaptseva,A.S. ; Fedin,D.A. ; Hansen,S. ; Presura,R. ; Chamberlain,D. ; Ouart,N. ; Jones,A. ; LeBeau,H.
出版情報: X-ray optics, instruments, and missions IV : 30-31 July 2000, San Diego, USA.  pp.203-214,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4138
2.

国際会議録
国際会議録
2. "Powerful microfocus x-ray and hard x-ray 1 MA x-pinch plasma source for imaging, spectroscopy, and polarimetry"
Kantsyrev,V.L. ; Bauer,B.S. ; Shlyaptseva,A.S. ; Fedin,D.A. ; Hansen,S. ; Presura,R. ; Fuelling,S. ; Batie,S. ; Oxner,A. ; Faretto,H. ; Ouart,N.D. ; Keely,S. ; LeBeau,H. ; Chamberlain,D. ; Kantsyrev,V.L.
出版情報: Advances in laboratory-based X-ray sources and optics II : 30 July-1 August 2001, San Diego, USA.  pp.62-73,  2001.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4502
3.

国際会議録
国際会議録
3. X-pinch driven by 0.9 MA: a powerful pulsed soft x-ray point source
Kantsyrev,V.L. ; Bauer,B.S. ; Shlyaptseva,A.S. ; Fedin,D.A. ; Hansen,S. ; Presura,R. ; Batie,S. ; Cline,W. ; Faretto,H. ; Galloudec,B.Le ; Oxner,A. ; McCrorey,D. ; Ouart,N. ; LeBeau,H.
出版情報: Advances in laboratory-based X-ray sources and optics : 31 July-1 August 2000, San Diego, USA.  pp.51-58,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4144