C. Alt ; H. Lee ; C. Pitsillides ; M. Puoris'haag ; C. P. Lin
出版情報:
Imaging, manipulation, and analysis of biomolecules, cells, and tissues V : 22-24 January 2007, San Jose, California, USA. 2007. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
D. Koppel ; C. Chen ; Y. Wang ; H. Lee ; J. Gu ; A. Poirson ; R. Wolters
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Medical imaging 2007, Visualization and image-guided procedures : 18-20 February 2007, San Diego, California, USA. 2007. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
K.J. Byeon ; S.H. Hong ; K.Y. Yang ; D.K. Kim ; H. Lee
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THERMEC 2006 : supplement to THERMEC 2006, 5th International conference on processing and manufacturing of advanced materials, July 4-8, 2006, Vancouver, Canada. 539-543 pp.3580-3588, 2007. Stafa-Zuerich. Trans Tech Publications
J. Lee ; N. Kim ; H. Lee ; J. B. Seo ; H. J. Won ; Y. M. Shin ; Y. G. Shin
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Medical imaging 2007, Image processing : 18-20 February 2007, San Diego, California, USA. 2007. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
K.J. Byeon ; S.H. Hong ; K.Y. Yang ; D.K. Kim ; H. Lee
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THERMEC 2006 : supplement to THERMEC 2006, 5th International conference on processing and manufacturing of advanced materials, July 4-8, 2006, Vancouver, Canad. 539-543 pp.968-973, 2007. Stafa-Zuerich. Trans Tech Publications
Environmental Aspects, Applications and Implications of Nanomaterials and Nanotechnology 2013 : Topical Conference at the 2013 AIChE Annual Meeting: Global Challenges for Engineering a Sustainable Future : San Francisco, California, USA, 3-8 November 2013. pp.15-15, 2013. New York. American Institute of Chemical Engineers
Fringe '99 : advancing ERS, SAR interferometry from applications towards operations, 10-12 November 1999, Centre Spatial de Liège, Liège, Belgium. 2000. Noordwijk, The Netherlands. ESA Publications Division
N. Ikeno ; T. Tachibana ; H. Lee ; H. Yoshida ; K. Arafune
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Defects-recognition, imaging and physics in semiconductors XIV : selected, peer reviewed papers from the 14th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors, September 25-29, 2011, Miyazaki, Japan. pp.161-164, 2012. Aedermannsdorf, Switzerland. Trans Tech Publications
W. Lo ; Y. Liu ; H. Chen ; S. Yang ; T. Sun ; L. Chiou ; G. Huang ; C. Dong ; H. Lee
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Multiphoton microscopy in the biomedical sciences VII : 21-23 January 2007, San Jose, California, USA. 2007. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Len Borucki ; H. Lee ; Y. Zhuang ; A. Philipossian
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2004 AIChE annual meeting, Austin Covention Center, Austin, Texas, November 7-12 : conference proceedings. pp.91d-, 2004. New York. American Institute of Chemical Engineers
S.I. Zones ; H. Lee ; M.E. Davis ; J. Casci ; A.W. Burton
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Molecular sieves : from basic research to industrial applications : proceedings of the 3rd International Zeolite Symposium (3rd FEZA) Prague, Czech Republic 23-26 August 2005. 158A pp.1-10, 2005. Amsterdam. Elsevier
R.U. Martinelli ; D.Z. Garbuzov ; H. Lee ; P.K. York ; R.J. Menna
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Laser diodes and applications : 8-10 February 1995 San Jose, California. pp.250-261, 1995. Bellingham, WA. Society of Photo-optical Instrumentation Engineers
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Proceedings of SPIE - the International Society for Optical Engineering
P.K. York ; D.Z. Garbuzov ; H. Lee ; R.U. Martinelli ; R.J. Menna
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Optical instrumentation for gas emissions monitoring and atmospheric measurements : 7-10 November 1994, McLean, Virginia. pp.98-107, 1995. Bellingham, WA. Society of Photo-optical Instrumentation Engineers
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Proceedings of SPIE - the International Society for Optical Engineering
S. An ; H. Lee ; S. Lee ; B. O ; H. Kim ; S. Park ; E. Lee
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Optoelectronic integrated circuits IX : 22-24 January 2007, San Jose, California. 2007. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
B. Mika ; H. Lee ; J. M. Gonzalez ; S. B. Vinson ; H. Liang
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Nanosensors, microsensors, and biosensors and systems 2007 : 21-22 March 2007, San Diego, California, USA. 2007. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Laser source and system technology for defense and security III : 9-10 April 2007, Orlando, Florida, USA. 2007. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
K. T. Kapale ; L. D. Didomenico ; H. Lee ; P. Kok ; J. P. Dowling
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Noise and fluctuations in photonics, quantum optics, and communications : 21-24 May 2007, Florence, Italy. 2007. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
S. Kim ; H. Lee ; B. Kang ; S. Lee ; D. Park ; C. Kim
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Human vision and electronic imaging XII : 29 January-1 February 2007, San Jose, California, USA. 2007. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
J. T. Kim ; J. J. Ju ; S. Park ; S. K. Park ; M. Kim ; H. Lee ; M. Lee
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Micromachining technology for micro-optics and nano-optics V and microfabrication process technology XII : 22-24 January 2007, San Jose, California, USA. 2007. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Fifth International Symposium on Instrumentation Science and Technology. 1 pp.71330H-1-71330H-7, 2008. Bellingham, Wash.. Society of Photo-optical Instrumentation Engineers
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Proceedings of SPIE - the International Society for Optical Engineering
Photomask and next-generation lithography mask technology XV. 2 pp.70282V-1-70282V-8, 2008. Bellingham, Wash.. Society of Photo-optical Instrumentation Engineers
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Proceedings of SPIE - the International Society for Optical Engineering
Ground-based and airborne instrumentation for astronomy II. 3 pp.70144E-1-70144E-12, 2008. Bellingham, Wash.. Society of Photo-optical Instrumentation Engineers
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Proceedings of SPIE - the International Society for Optical Engineering
Photomask and next-generation lithography mask technology XV. 1 pp.702818-1-702818-9, 2008. Bellingham, Wash.. Society of Photo-optical Instrumentation Engineers
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Proceedings of SPIE - the International Society for Optical Engineering
H. Lee ; A. Ranjan ; D. Prager ; K. A. Bandy ; E. Meyette
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Metrology, inspection, and process control for microlithography XXII. 1 pp.69220T-1-69220T-13, 2008. Bellingham, Wash.. Society of Photo-optical Instrumentation Engineers
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Proceedings of SPIE - the International Society for Optical Engineering
Metrology, inspection, and process control for microlithography XXII. 2 pp.692227-1-692227-10, 2008. Bellingham, Wash.. Society of Photo-optical Instrumentation Engineers
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Proceedings of SPIE - the International Society for Optical Engineering
G. B. Dalton ; I. J. Lewis ; D. G. Bonfield ; A. R. Holmes ; C. B. Brooks ; H. Lee ; I. A. J. Tosh ; T. R. Froud ; M. Patel ; N. A. Dipper ; C. Blackburn
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Ground-based and Airborne Instrumentation for Astronomy. pp.62694A-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Nanosensors, microsensors, and biosensors and systems 2007 : 21-22 March 2007, San Diego, California, USA. 2007. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
T. Pace ; H. Lee ; D. Manville ; D. Vogel ; M. Walker ; G. Cloud ; J. A. Puritz
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Display technologies and applications for defense, security, and avionics : 12 April 2007, Orlando, Florida, USA. 2007. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Display technologies and applications for defense, security, and avionics : 12 April 2007, Orlando, Florida, USA. 2007. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Display technologies and applications for defense, security, and avionics : 12 April 2007, Orlando, Florida, USA. 2007. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering