1.

国際会議録
国際会議録
1. PHOTOREFLECTANCE CHARACTERIZATION OF ETCH-INDUCED DAMAGE IN DRY ETCHED GaAs
Glembocki, O. J. ; Tuchman, J. A. ; Ko, K. K. ; Pang, S. W. ; Giordana, A. ; Stutz, C. E.
出版情報: Diagnostic techniques for semiconductor materials processing : Symposium held November 29-December 2, 1993, Boston, Massachusetts, U.S.A..  pp.153-,  1994.  Pittsburgh.  MRS - Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 324
2.

国際会議録
国際会議録
2. Estimation of Firing Temperature and Compositional Variability of Archaeological Pottery by Differential Scanning Calorimetry
Giordana, A. ; Peacock, E. ; McCarthy, M. ; Guilbeau, K. ; Jacobs, P. ; Seger, J. D. ; Ramsey, W. G.
出版情報: Materials issues in art and archaeology VII : symposium held November 30-December 3, 2004, Boston, Massachusetts, U.S.A..  pp.311-320,  2005.  Warrendale, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 852
3.

国際会議録
国際会議録
3. The Growth and Characterization of Large Diameter Silicon Carbide Substrates
Gupta, A. ; Yoganathan, M. ; Burton, J. ; Byrd, N. ; Dimondi, A. ; Edwards, S. ; Giordana, A. ; Glesener, J. ; Harding, J. ; Long, F. ; Mitchel, W. ; Saxler, A. ; Sostak, R. ; Whitlock, J. ; Thomas, R.N. ; Anderson, T.
出版情報: Silicon carbide--materials, processing and devices : symposium held November 27-29, 2000, Boston, Massachusetts, U.S.A..  2001.  Warrendale, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 640
4.

国際会議録
国際会議録
4. Characterization of Low Temperature GaAs
Tadayon, B. ; Twigg, M. ; Fatemi, M. ; Frankel, M. ; Giordana, A. ; Katzer, D.S.
出版情報: Proceedings of the Twenty-first State-of-the-Art Program on Compound Semiconductors (SOTAPOCS XXI).  pp.289-294,  1994.  Pennington, NJ.  Electrochemical Society
シリーズ名: Electrochemical Society Proceedings Series
シリーズ巻号: 1994-34