Fluctuation microscopy: a technique for revealing atomic correlations in structurally noisy (disordered) materials (Invited Paper)
- 著者名:
- Treacy, M.M.J. ( Consultant (USA) )
- Gibson, J.M. ( Argonne National Las. (USA) )
- 掲載資料名:
- Noise as a Tool for Studying Materials
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 5112
- 発行年:
- 2003
- 開始ページ:
- 48
- 終了ページ:
- 60
- 総ページ数:
- 13
- 出版情報:
- Bellingham, Wash.: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819449726 [0819449725]
- 言語:
- 英語
- 請求記号:
- P63600/5112
- 資料種別:
- 国際会議録
類似資料:
Materials Research Society |
MRS - Materials Research Society |
Materials Research Society |
SPIE-The International Society for Optical Engineering |
Materials Research Society |
Materials Research Society |
Materials Research Society |
Materials Research Society |
Materials Research Society |
11
国際会議録
Atomic Number Imaging of Supported Catalyst Particles by Scanning Transmission Electron Microscope
American Chemical Society |
Materials Research Society |
Materials Research Society |